Arrigo, R., Sasaki, T., Callison, J., Gianolio, D., & Schuster, M. (2022). Monitoring dynamics of defects and single Fe atoms in N-functionalized few-layer graphene by in situ temperature programmed scanning transmission electron microscopy. Journal of Energy Chemistry, 64, 520-530. https://doi.org/10.1016/j.jechem.2021.05.005