Mom, Rik V, Sandoval-Diaz, Luis-Ernesto, Gao, Dunfeng, Chuang, Cheng-Hao, Carbonio, Emilia A, Jones, Travis E, Arrigo, Rosa, Ivanov, Danail, Hävecker, Michael, Roldan Cuenya, Beatriz, Schlögl, Robert, Lunkenbein, Thomas, Knop-Gericke, Axel, Velasco-Vélez, Juan-Jesús, "Assessment of the Degradation Mechanisms of Cu Electrodes during the CO", ACS applied materials & interfaces,