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Temporally resolved laser induced plasma diagnostics of single crystal silicon - effects of ambient pressure (2008)
Journal Article

Laser-Induced Breakdown Spectroscopy of silicon was performed using a nanosecond pulsed frequency
doubled Nd:YAG (532 nm) laser. The temporal evolution of the laser ablation plumes in air at atmospheric
pressure and at an ambient pressure of ∼10−5... Read More about Temporally resolved laser induced plasma diagnostics of single crystal silicon - effects of ambient pressure.

Temporally resolved laser induced plasma diagnostics of single crystal silicon - effects of ambient pressure (2008)
Journal Article

Laser-Induced Breakdown Spectroscopy of silicon was performed using a nanosecond pulsed frequency
doubled Nd:YAG (532 nm) laser. The temporal evolution of the laser ablation plumes in air at atmospheric
pressure and at an ambient pressure of ∼10−5... Read More about Temporally resolved laser induced plasma diagnostics of single crystal silicon - effects of ambient pressure.