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Perspective distortion modeling for image measurements

Bousaid, A; Theodoridis, T; Nefti-Meziani, S; Davis, S

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Authors

A Bousaid

T Theodoridis

S Nefti-Meziani

S Davis



Abstract

A perspective distortion modelling for monocular view that is based on the fundamentals of perspective projection is presented in this work. Perspective projection is considered to be the most ideal and realistic model among others, which depicts image formation in monocular vision. There are many approaches trying to model and estimate the perspective effects in images. Some approaches try to learn and model the distortion parameters from a set of training data that work only for a predefined structure. None of the existing methods provide deep understanding of the nature of perspective problems. Perspective distortions, in fact, can be described by three different perspective effects. These effects are pose, distance and foreshortening. They are the cause of the aberrant appearance of object shapes in images. Understanding these phenomena have long been an interesting topic for artists, designers and scientists. In many cases, this problem has to be necessarily taken into consideration when dealing with image diagnostics, high and accurate image measurement, as well as accurate pose estimation from images. In this work, a perspective distortion model for every effect is developed while elaborating the nature of perspective effects. A distortion factor for every effect is derived, then followed by proposed methods, which allows extracting the true target pose and distance, and correcting image measurements.

Citation

Bousaid, A., Theodoridis, T., Nefti-Meziani, S., & Davis, S. (2020). Perspective distortion modeling for image measurements. IEEE Access, 8, 15322-15331. https://doi.org/10.1109/ACCESS.2020.2966716

Journal Article Type Article
Acceptance Date Jan 13, 2020
Online Publication Date Jan 15, 2020
Publication Date Jan 15, 2020
Deposit Date Feb 13, 2020
Publicly Available Date Feb 13, 2020
Journal IEEE Access
Publisher Institute of Electrical and Electronics Engineers
Volume 8
Pages 15322-15331
DOI https://doi.org/10.1109/ACCESS.2020.2966716
Publisher URL https://doi.org/10.1109/ACCESS.2020.2966716
Related Public URLs https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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