Fault-tolerance of field-programmable gate arrays subjected to radiation

Brown, SJ

Abstract

This thesis describes a technology and methodology designed and
developed for the study of certain aspects of reliability in digital
electronics sub-systems, as implemented on field-programmable gate
arrays (FPGAs), while being subjected to small-scale sources of radiation.
The technology developed is in the form of a platform for the FPGA under
investigation, and an associated configuration and test system. The
platforms for the devices are exchangeable, so that a range of different
generations, manufacturers and models of FPGA, or other processing
element, can be investigated. The circuit boards have been designed to fit
inside a small volume, in order to be accommodated by a typical
laboratory desk-top source of radiation such as neutrons, alpha or beta
particles.
To maximise it's usefulness, the test system was designed to be used for a
wide range of investigations and prototyping projects.
In order to prove the applicability of the system developed, an experiment
was run. A triple-module redundant (TMR) system is constructed to test
the raw susceptibility of the underlying FPGAs to faults, and to test how
well the TMR system copes with correcting such errors. This is done while
the whole system is subjected to ionizing radiation in the form of neutrons.
This reveals the effects of radiation on the ICs, and provides an
accelerated test for tolerance to other potential causes of faults.
We are looking for -
- confirmation of theory and other's measurements on upset rate
- confirmation that fault-tolerance works We conclude that: (1) the experimental test system passed the required
tests and measurements, and produces results, (2) the SEU rate, as
measured in the example experiment, is consistent with expectations, and
(3) a conventional commercial FPGA, programmed to perform a function
reliably using triple-module redundancy, will indeed continue to perform
correctly under the influence of SEU-inducing radiation.

Citation

Brown, S. Fault-tolerance of field-programmable gate arrays subjected to radiation. (Thesis). Salford : University of Salford

• Thesis Type: Thesis
• Deposit Date: Oct 3, 2012
• Award Date: Jan 1, 2010