Optical absorption losses in electrical contacts used in thin film solar cells

Holovsky, J; Purkrt, A; Izak, T; Poruba, A; Vanecek, M; Dagkaldiran, U; Yates, HM; Evans, P; Sheel, DW

Abstract

The standardized techniques to characterize the optical properties of thin films are of high importance for development, optimiza-tion and reliable production of thin film solar cells. We apply op-tical transmittance & reflectance spectroscopy, photothermal de-flection spectroscopy (PDS) and laser calorimetry (LC) to evalu-ate optical absorption losses at rough interface between rough thin conductive oxide (TCO) and metal films used as backreflec-tors and electrical contacts in thin film solar cells. The dielectric function of the rough metal can be calculated in Landau-Lifshitz-Looyenga model fitting only one unknown parameter which greatly simplifies modelling of the optical properties of thin film solar cells.

Citation

Holovsky, J., Purkrt, A., Izak, T., Poruba, A., Vanecek, M., Dagkaldiran, U., …Sheel, D. (2010). Optical absorption losses in electrical contacts used in thin film solar cells. Physica status solidi. A, Applied research, 207(9), 2170-2173. https://doi.org/10.1002/pssa.200925432

• Journal Article Type: Article
• Publication Date: Jan 1, 2010
• Deposit Date: Oct 21, 2011
• Journal: Physica Status Solidi a Applications and Materials Science
• Print ISSN: 0031-8965
• Publisher: Akademie Verlag
• Peer Reviewed: Peer Reviewed
• Volume: 207
• Issue: 9
• Pages: 2170-2173
• DOI: https://doi.org/10.1002/pssa.200925432
• Publisher URL: http://dx.doi.org/10.1002/pssa.200925432