J Holovsky
Optical absorption losses in electrical contacts used in thin film solar cells
Holovsky, J; Purkrt, A; Izak, T; Poruba, A; Vanecek, M; Dagkaldiran, U; Yates, HM; Evans, P; Sheel, DW
Authors
A Purkrt
T Izak
A Poruba
M Vanecek
U Dagkaldiran
HM Yates
P Evans
DW Sheel
Abstract
The standardized techniques to characterize the optical properties of thin films are of high importance for development, optimiza-tion and reliable production of thin film solar cells. We apply op-tical transmittance & reflectance spectroscopy, photothermal de-flection spectroscopy (PDS) and laser calorimetry (LC) to evalu-ate optical absorption losses at rough interface between rough thin conductive oxide (TCO) and metal films used as backreflec-tors and electrical contacts in thin film solar cells. The dielectric function of the rough metal can be calculated in Landau-Lifshitz-Looyenga model fitting only one unknown parameter which greatly simplifies modelling of the optical properties of thin film solar cells.
| Journal Article Type | Article |
|---|---|
| Publication Date | Jan 1, 2010 |
| Deposit Date | Oct 21, 2011 |
| Journal | Physica Status Solidi a Applications and Materials Science |
| Print ISSN | 0031-8965 |
| Electronic ISSN | 1521-396X |
| Publisher | Akademie Verlag |
| Peer Reviewed | Peer Reviewed |
| Volume | 207 |
| Issue | 9 |
| Pages | 2170-2173 |
| DOI | https://doi.org/10.1002/pssa.200925432 |
| Publisher URL | http://dx.doi.org/10.1002/pssa.200925432 |