Testing fault-tolerant systems using a unified error model

Tyrrell, A.M.; Bass, J.M.

Abstract

This paper presents a method of designing test data based around a unified error model. The model allows error 'surfaces' to be defined for a given application, and used to define a test region(s) that give a measure of test coverage. The paper applies the model to an illustrative example to show how it might be used in an autopilot model.

• Presentation Conference Type: Conference Paper (published)
• Conference Name: 23rd Euromicro Conference New Frontiers of Information Technology
• Start Date: Sep 1, 1997
• End Date: Sep 4, 1997
• Online Publication Date: Aug 6, 2002
• Publication Date: 1997-09
• Deposit Date: Jan 19, 2024
• Publisher: Institute of Electrical and Electronics Engineers
• DOI: https://doi.org/10.1109/EMSCNT.1997.658455