Analytical Review of Cybersecurity for Embedded Systems

Aloseel, Abdulmohsan; He, Hongmei; Shaw, Carl; Khan, Muhammad Ali

Abstract

To identify the key factors and create the landscape of cybersecurity for embedded systems (CSES), an analytical review of the existing research on CSES has been conducted. The common properties of embedded systems, such as mobility, small size, low cost, independence, and limited power consumption when compared to traditional computer systems, have caused many challenges in CSES. The conflict between cybersecurity requirements and the computing capabilities of embedded systems makes it critical to implement sophisticated security countermeasures against cyber-attacks in an embedded system with limited resources, without draining those resources. In this study, twelve factors influencing CSES have been identified: (1) the components; (2) the characteristics; (3) the implementation; (4) the technical domain; (5) the security requirements; (6) the security problems; (7) the connectivity protocols; (8) the attack surfaces; (9) the impact of the cyber-attacks; (10) the security challenges of the ESs; (11) the security solutions; and (12) the players (manufacturers, legislators, operators, and users). A Multiple Layers Feedback Framework of Embedded System Cybersecurity (MuLFESC) with nine layers of protection is proposed, with new metrics of risk assessment. This will enable cybersecurity practitioners to conduct an assessment of their systems with regard to twelve identified cybersecurity aspects. In MuLFESC, the feedback from the system-components layer to the system-operations layer could help implement ‘‘Security by Design’’ in the design stage at the bottom layer. The study provides a clear landscape of CSES and, therefore, could help to find better comprehensive solutions for CSES

• Journal Article Type: Article
• Acceptance Date: Dec 3, 2020
• Online Publication Date: Dec 21, 2020
• Publication Date: Jan 5, 2021
• Deposit Date: Jun 10, 2025
• Publicly Available Date: Jun 11, 2025
• Journal: IEEE Access
• Electronic ISSN: 2169-3536
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 9
• DOI: https://doi.org/10.1109/access.2020.3045972