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On the measurement of the Pockels effect in strained silicon (2015)
Journal Article
Azadeh, S., Merget, F., Nezhad, M., & Witzens, J. (2015). On the measurement of the Pockels effect in strained silicon. Optics Letters, 40(8), 1877-1880. https://doi.org/10.1364/OL.40.001877

We measure the voltage-dependent phase shift in silicon waveguides strained by a silicon nitride layer and show that, in our measurements, the phase shift is due to free carrier accumulation inside the waveguides. Nonetheless, inverting the applied v... Read More about On the measurement of the Pockels effect in strained silicon.