PJ Withers
Neutron and synchrotron x-ray strain scanning
Withers, PJ; Webster, PJ
Authors
PJ Webster
Abstract
Neutron and synchrotron X-ray strain scanning provide the opportunity for mapping residual strain distributions within polychrystalline materials, non-destructively. the neutron method is now reasonably mature, industrial standards for measurement are being defined and new dedicated neutron strain scanners are being built at ISIS in the Uk and at the ILL, France, as well as in the United States. Synchrotron strain scanning on the other hand is relatively new and is much less well developed but, with penetrations typically hundreds of time greater than most laboratory X-rays and intensities millions of times greater, it can provide maps of near- and sub-surface strain of unparalleled detail and strain resolution. The capabilities and complementarity of the two methods are reviewed and contrasted in this paper through a series of case studies.
Citation
Withers, P., & Webster, P. (2001). Neutron and synchrotron x-ray strain scanning. Strain, 37(1), 19-33. https://doi.org/10.1111/j.1475-1305.2001.tb01216.x
Journal Article Type | Article |
---|---|
Publication Date | Feb 1, 2001 |
Deposit Date | Oct 22, 2007 |
Journal | Strain |
Print ISSN | 0039-2103 |
Publisher | Wiley |
Peer Reviewed | Peer Reviewed |
Volume | 37 |
Issue | 1 |
Pages | 19-33 |
DOI | https://doi.org/10.1111/j.1475-1305.2001.tb01216.x |
Keywords | Residual stress, strain scanning, neuron diffraction, non-destructive testing |
Publisher URL | http://dx.doi.org/10.1111/j.1475-1305.2001.tb01216.x |
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