Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method

Bardosova, M; Pemble, ME; Povey, IM; Tredgold, RH; Whitehead, DE

Abstract

The Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the ``A'' domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes.

Citation

Bardosova, M., Pemble, M., Povey, I., Tredgold, R., & Whitehead, D. (2006). Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method. Applied Physics Letters, 89(9), 093116. https://doi.org/10.1063/1.2339031

• Journal Article Type: Article
• Publication Date: Aug 30, 2006
• Deposit Date: Aug 23, 2007
• Publicly Available Date: Aug 23, 2007
• Journal: Applied Physics Letters
• Print ISSN: 0003-6951
• Publisher: AIP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 89
• Issue: 9
• Pages: 093116
• DOI: https://doi.org/10.1063/1.2339031
• Keywords: Light reflection, photonic crystals, thin films, Langmuir-Blodgett films, optical films, reflectivity, silicon compounds, visible spectra, infrared spectra
• Publisher URL: http://dx.doi.org/10.1063/1.2339031
• Related Public URLs: http://www.aip.org/; http://apl.aip.org/