Kerr nonlinearity in silicon beyond 2.35μm

Zlatanovic, S.; Gholami, F.; Simic, A.; Liu, L.; Alic, N.; Nezhad, M.; Fainman, Y.; Radic, S.

Abstract

We present measurements of χ ^(3) in silicon in the 2.35 to 2.75μm interval, showing Kerr coefficients close to 1×10^( -18) m ^(2) /W. The results clearly identify silicon as a promising platform for nonlinear processes in the mid-infrared.

• Presentation Conference Type: Edited Proceedings
• Conference Name: 2011 IEEE Photonics Society Summer Topical Meeting
• Start Date: Jul 18, 2011
• End Date: Jul 20, 2011
• Publication Date: 2011
• Deposit Date: Aug 21, 2024
• Publisher: Institute of Electrical and Electronics Engineers
• Pages: 59-60
• Series ISSN: 2376-8614
• Book Title: 2011 IEEE Photonics Society Summer Topical Meeting Series
• ISBN: 978-1-4244-5730-4
• DOI: https://doi.org/10.1109/PHOSST.2011.6000043