S. Zlatanovic
Kerr nonlinearity in silicon beyond 2.35μm
Zlatanovic, S.; Gholami, F.; Simic, A.; Liu, L.; Alic, N.; Nezhad, Maziar; Fainman, Y.; Radic, S.
Authors
F. Gholami
A. Simic
L. Liu
N. Alic
Dr Maziar Nezhad M.P.Nezhad@salford.ac.uk
Professor Nanophotonics Microsystems Eng
Y. Fainman
S. Radic
Abstract
We present measurements of χ (3) in silicon in the 2.35 to 2.75μm interval, showing Kerr coefficients close to 1×10 -18 m 2 /W. The results clearly identify silicon as a promising platform for nonlinear processes in the mid-infrared.
| Presentation Conference Type | Conference Paper (published) |
|---|---|
| Conference Name | 2011 IEEE Photonics Society Summer Topical Meeting |
| Start Date | Jul 18, 2011 |
| End Date | Jul 20, 2011 |
| Publication Date | 2011 |
| Deposit Date | Aug 27, 2024 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 59-60 |
| Series ISSN | 2376-8614 |
| Book Title | 2011 IEEE Photonics Society Summer Topical Meeting Series |
| ISBN | 978-1-4244-5730-4 |
| DOI | https://doi.org/10.1109/PHOSST.2011.6000043 |
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