Outputs (6)

Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition (2001)
Journal Article
Gremenok, V., Martin, R., Bodnar, I., Yakushev, M., Schmitz, W., Bente, K., …Tomlinson, R. (2001). Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition. Thin Solid Films, 394(1-2), 23-28. https://doi.org/10.1016/S0040-6090%2801%2901178-6

Thin films of the chalcopyrite compound CuGaXIn1-XTe2 (0=<X=<1) have been prepared by pulsed laser deposition (PLD) of prereacted material onto glass substrates. The structural and optical properties of these films have been investigated usin... Read More about Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition.

Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition (2001)
Journal Article
Gremenok, V., Martin, R., Bodnar, I., Yakushev, M., Schmitz, W., Bente, K., …Tomlinson, R. (2001). Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition. Thin Solid Films, 394(1-2), 23-28. https://doi.org/10.1016/S0040-6090%2801%2901178-6

Thin films of the chalcopyrite compound CuGaXIn1-XTe2 (0=<X=<1) have been prepared by pulsed laser deposition (PLD) of prereacted material onto glass substrates. The structural and optical properties of these films have been investigated usin... Read More about Characterization of polycrystalline Cu(In,Ga)Te2 thin films prepared by pulsed laser deposition.

Effects of D+ implantation of CIGS thin films through a CdS layer (2001)
Journal Article
Yakushev, M., Martin, R., Krustok, J., Mudriy, A., Holman, D., Schock, H., …Tomlinson, R. (2001). Effects of D+ implantation of CIGS thin films through a CdS layer. Thin Solid Films, 387(1-2), 201-204. https://doi.org/10.1016/S0040-6090%2800%2901730-2

Cu(InGa)Se2 thin films coated with a 30 nm CdS layer were implanted with doses of 1014–1016 cm−2 of 2.5 keV D+ at room temperature. Implanted and non-implanted areas of the films were characterised using low-temperature photoluminescence (PL). A broa... Read More about Effects of D+ implantation of CIGS thin films through a CdS layer.

Effects of D+ implantation of CIGS thin films through a CdS layer (2001)
Journal Article
Yakushev, M., Martin, R., Krustok, J., Mudriy, A., Holman, D., Schock, H., …Tomlinson, R. (2001). Effects of D+ implantation of CIGS thin films through a CdS layer. Thin Solid Films, 387(1-2), 201-204. https://doi.org/10.1016/S0040-6090%2800%2901730-2

Cu(InGa)Se2 thin films coated with a 30 nm CdS layer were implanted with doses of 1014–1016 cm−2 of 2.5 keV D+ at room temperature. Implanted and non-implanted areas of the films were characterised using low-temperature photoluminescence (PL). A broa... Read More about Effects of D+ implantation of CIGS thin films through a CdS layer.

Structural and optical investigations on CdS thin films grown by chemical bath technique (2001)
Journal Article
Ramaiah, K., Pilkington, R., Hill, A., Tomlinson, R., & Bhatnagar, A. (2001). Structural and optical investigations on CdS thin films grown by chemical bath technique. Materials Chemistry and Physics, 68(1-3), 22-30. https://doi.org/10.1016/S0254-0584%2800%2900281-9

Cadmium sulphide (CdS) thin films have been prepared by using a chemical bath deposition (CBD) method. Structural analysis (XRD and TEM) revealed that the films showed hexagonal structure with lattice constants a=0.4015 nm and c=0.6545 nm. On anneali... Read More about Structural and optical investigations on CdS thin films grown by chemical bath technique.

Structural and optical investigations on CdS thin films grown by chemical bath technique (2001)
Journal Article
Ramaiah, K., Pilkington, R., Hill, A., Tomlinson, R., & Bhatnagar, A. (2001). Structural and optical investigations on CdS thin films grown by chemical bath technique. Materials Chemistry and Physics, 68(1-3), 22-30. https://doi.org/10.1016/S0254-0584%2800%2900281-9

Cadmium sulphide (CdS) thin films have been prepared by using a chemical bath deposition (CBD) method. Structural analysis (XRD and TEM) revealed that the films showed hexagonal structure with lattice constants a=0.4015 nm and c=0.6545 nm. On anneali... Read More about Structural and optical investigations on CdS thin films grown by chemical bath technique.