Enhancing Infrared Small Target Detection: A Saliency-Guided Multi-Task Learning Approach

Liu, Zhaoying; Zhang, Yuxiang; He, Junran; Zhang, Ting; Rehman, Sadaqat ur; Saraee, Mohamad; Sun, Changming

Abstract

Object detection in infrared images poses a considerable challenge due to its small-scale targets, low contrast and poor signal-to-clutter ratio, often resulting in a high false alarm rate. To improve the detection accuracy on infrared small targets, we introduce Light-SGMTLM, a lightweight and saliency-guided multi-task learning model. This model integrates saliency detection into the YOLOv5x framework through a parallel multi-task learning structure and employs a joint loss function during training. Such integration significantly alleviates the impact of complex backgrounds and improves the precision of small target localization. Moreover, we have developed a streamlined module, termed SIWD, to create a more agile backbone, which establishes an optimal balance between precision and efficiency, making the model more suitable for situations with limited computational resources. Comprehensive comparative experiments were conducted on six infrared small target datasets, namely, Small-ExtIRShip, Small-SSDD, IHAST, NUAA-SIRST, IRSTD-1k, and IRDST, and we assessed the model’s performance against ten leading target detection models, such as YOLOv7, YOLOv8, DINO, and Relation-DETR. The findings reveal that our method’s unique joint learning architecture, combining saliency and object detection tasks, significantly improves accuracy for infrared small target detection. Notably, it achieved impressive mean average precision (mAP) values of 92.60% and 75.71% on the NUAA-SIRST and IRSTD-1k datasets, respectively.

• Journal Article Type: Article
• Acceptance Date: Jan 15, 2025
• Online Publication Date: Jan 16, 2025
• Publication Date: Jan 31, 2025
• Deposit Date: Jan 17, 2025
• Publicly Available Date: Jan 22, 2025
• Journal: IEEE Transactions on Intelligent Transportation Systems
• Print ISSN: 1524-9050
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Pages: 1-16
• DOI: https://doi.org/10.1109/tits.2024.3520424