In situ transmission electron microscopy studies of radiation damage in copper indium diselenide
(2006)
Journal Article
Donnelly, S., Hinks, J., Edmondson, P., Pilkington, R., Yakushev, M., & Birtcher, R. (2006). In situ transmission electron microscopy studies of radiation damage in copper indium diselenide. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 242(1-2), 686-689. https://doi.org/10.1016/j.nimb.2005.08.089
The ternary semiconductor, CuInSe2 (CIS), is a promising semiconductor material for use in photovoltaic applications. Of particular interest is the high tolerance of this material to bombardment by energetic particles. This is of particular importanc... Read More about In situ transmission electron microscopy studies of radiation damage in copper indium diselenide.