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A deep explainable model for fault prediction using IoT sensors

Mansouri, T; Vadera, S

Authors



Abstract

IoT sensors and deep learning models can widely be applied for fault prediction. Although
deep learning models are considerably more potent than many conventional machine learning models, they
are not transparent. This paper first examines different deep learning techniques to carry out univariate time
series analysis based on vibration sensors installed on four industrial bearings to predict a fault occurring in
a predefined time window. Several recurrent neural networks are used to develop fault prediction models.
An empirical evaluation of these models shows that all models perform well; however, hybrid models
outperform other models when the time window increases. Then, instance-wise feature selection has been
considered to highlight the most contributing features for its outputs regarding any input. In this problem,
the main challenge is to propose a trainable feature selection model with the minimum number of selected
features whilst its performance is close to the baseline model. This paper develops a novel explainable
method called the Gumbel-Sigmoid eXplanator (GSX) to tackle these problems. In a nutshell: (i) we have
developed a differentiable and trainable selector, and (ii) we utilize regularization to control the number
of features for each instance flexibly. The proposed method is model agnostic, and empirical evaluations
on two datasets show that GSX can not only solve the problems identified with two other state-of-the-art
methods but also outperform them in terms of accuracy and run-time.

Citation

Mansouri, T., & Vadera, S. (2022). A deep explainable model for fault prediction using IoT sensors. IEEE Access, https://doi.org/10.1109/ACCESS.2022.3184693

Journal Article Type Article
Acceptance Date Jun 6, 2022
Online Publication Date Jun 21, 2022
Publication Date Jun 21, 2022
Deposit Date Jun 10, 2022
Publicly Available Date Jul 1, 2022
Journal IEEE Access
Publisher Institute of Electrical and Electronics Engineers
DOI https://doi.org/10.1109/ACCESS.2022.3184693
Publisher URL http://dx.doi.org/10.1109/ACCESS.2022.3184693
Related Public URLs https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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