Applying MLP and RBF classifiers in embedded condition monitoring and fault diagnosis systems
(2001)
Journal Article
Li, Y., Pont, M., Jones, N., & Twiddle, J. (2001). Applying MLP and RBF classifiers in embedded condition monitoring and fault diagnosis systems. Transactions of the Institute of Measurement and Control, 23(5), 315-343. https://doi.org/10.1177/014233120102300504
In this paper, results are presented from a comprehensive series of studies aimed at assessing the suitability of multilayered perceptron (MLP) and radial basis function (RBF) networks for use in embedded, microcontroller-based, condition monitoring... Read More about Applying MLP and RBF classifiers in embedded condition monitoring and fault diagnosis systems.